Probes to the Scanning Electron Microscope

CzechrepublicTenders notice for Probes to the Scanning Electron Microscope. The reference ID of the tender is 122479957 and it is closing on 11 Aug 2025.

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Tender Details

  • Country: Czech Republic
  • Summary: Probes to the Scanning Electron Microscope
  • CZT Ref No: 122479957
  • Deadline: 11 Aug 2025
  • Competition: ICB
  • Financier: Self Financed
  • Purchaser Ownership: Public
  • Tender Value: 8115703
  • Notice Type: Tender
  • Document Ref. No.: 452092-2025
  • Purchaser's Detail :
  • Purchaser : NATIONAL MUSEUM
    Address: Wenceslas Square 1700/68
    Town: Prague - New Town
    NUTS-CODE: CZ010
    Postal Code: 11000
    Phone: +420 602372586
    Email :lukas.kohout@akjato.cz
    URL :https://www.nm.cz/

  • Description :
  • The purpose of this tender is to conclude a purchase contract, which will be the supply of detectors to the scanning electron microscope, which is necessary for the modernization of the specialized digitization scientific workplace of the Paleontology Department of the National Museum focused on digitization microstructures.
    Scientifically usable digitization of microstructures using an electron microscope requires not only data on topography of micropovres (electron microscope), but also their elemental and structural nature (ESD, XRF and EBSD detectors). The purpose of the project is to integrate all these aspects in once devices and one compatible output. The electron microscope from the first stage is purchased by appropriate detectors within the second stage.
    Probes to the scanning electron microscope
    The purpose of this tendering procedure is to conclude a purchase contract, the subject of which will be the delivery of detectors to the scanning The electron microscope, which is necessary for the modernization of the specialized digitization scientific workplace of the Paleontology Department of the National Museum focused on the digitization of microstructures.
    Scientifically usable digitization of microstructures using an electron microscope requires not only data about Micropogoral topography (electron microscope), but also their elemental and structural nature (ESD, XRF and EBSD detectors). The purpose of the project is to integrate all these aspects in one device and one compatible output. The electron microscope from the first stage is taken within the second stage Real D ...
  • Documents :
  •  Tender Notice

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