Line Microscope

CzechrepublicTenders notice for Line Microscope. The reference ID of the tender is 116897749 and it is closing on 02 May 2025.

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Tender Details

  • Country: Czech Republic
  • Summary: Line Microscope
  • CZT Ref No: 116897749
  • Deadline: 02 May 2025
  • Competition: ICB
  • Financier: Self Financed
  • Purchaser Ownership: Public
  • Tender Value: 18200000
  • Notice Type: Tender
  • Document Ref. No.: 199664-2025
  • Purchaser's Detail :
  • Purchaser : INSTITUTE OF PHYSICS OF MATERIALS AS CR, V. I.
    Address: Žižkova 513/22

    Town: Brno - Veveři

    NUTS -CODE: CZ064

    Postal Code: 61600

    Phone: +420 532290497
    Email :maderova@ipm.cz

  • Description :
  • The subject of this public contract is a line -up electron microscope, equipped with Schottky
    electron source, two electron detectors (1 x SE, 1 x BSE) located in a microscope tube,
    two electrons (1 x SE, 1 x BSE) located in the microscopeelectrons (te). Furthermore, a tube with a focused ion bundle, a micromanipulator and a system of at least one work gas for ion deposition and a secondary ion detector is required. The microscope must be equipped with a non -free vacuum system,
    table for the operator and all components(eg control computer, monitor, compressor, cooler ...)
    necessary for autonomous operation of the microscope immediately after installation without intervention by the client. Microscope
    must be equipped with an IR camera for a view of the chamber during operation, a multi -purpose sample holder
    and a camera for easy navigation after the samples holder orDirectly after the sample.
    Rowing electron microscope
    The subject of this public contract is a line electron microscope, equipped with Schottky's electron source, two electron detectors (1 x SE, 1 x BSE) located in a microscope tube,
    two electrons (1 x se, 1 x BSE) located in the chambermicroscope and segmented by the detector of the expired electrons (TE). Furthermore, a tube with a focused ion bundle, a micromanipulator and a system of at least one work gas for ion deposition and a secondary ion detector is required. The microscope must be equippedVacuum ...
  • Documents :
  •  Tender Notice

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